Definitions
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Etymologies
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Help support Wordnik (and make this page ad-free) by adopting the word C-V.
Examples
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Also C-V count as measured by the pooper-scooper rule.
These are the times that try men's soles jhetley 2007
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CTRL C-V: "How come you're so wrong, my sweet neo-con?"
I forgot why I was posting this Ben Barren 2005
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Several others had come with him or ahead of him, trav-eling the long way from distant Earth to C-V and then out to the system border station slowly orbiting C-VII.
Nor Crystal Tears Foster, Alan Dean, 1946- 1982
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We have checked with both station command computer and EX Control on C-V.
Nor Crystal Tears Foster, Alan Dean, 1946- 1982
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The 4225-RPM can switch automatically among a 4225-PMU and C-V or DC source-measure instruments.
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Lee Stauffer, marketing engineer at Keithley, said that to characterize and understand any device, material, or process fully, engineers need to make three types of measurements: precision DC I-V measurements (which Keithley's 4200-SMU accomplishes), AC impedance (which C-V instruments like the company's Model 4210-CVU can make), and ultra-fast I-V, or transient I-V, measurements.
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The 4225-RPM can switch automatically among a 4225-PMU and C-V or DC source-measure instruments.
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The 4225-RPM can switch automatically among a 4225-PMU and C-V or DC source-measure instruments.
-
Lee Stauffer, marketing engineer at Keithley, said that to characterize and understand any device, material, or process fully, engineers need to make three types of measurements: precision DC I-V measurements (which Keithley's 4200-SMU accomplishes), AC impedance (which C-V instruments like the company's Model 4210-CVU can make), and ultra-fast I-V, or transient I-V, measurements.
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Lee Stauffer, marketing engineer at Keithley, said that to characterize and understand any device, material, or process fully, engineers need to make three types of measurements: precision DC I-V measurements (which Keithley's 4200-SMU accomplishes), AC impedance (which C-V instruments like the company's Model 4210-CVU can make), and ultra-fast I-V, or transient I-V, measurements.
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