electromigration love

electromigration

Definitions

from Wiktionary, Creative Commons Attribution/Share-Alike License.

  • noun physics the transport of small particles under the influence of an electric charge
  • noun chemistry the separation of ions of isotopes by this method

Etymologies

from Wiktionary, Creative Commons Attribution/Share-Alike License

electro- +‎ migration

Examples

  • Increasing current flow through the metal layers of the discharging path can also cause electromigration (EM) induced damages to interconnects.

    Electronicstalk - electronics industry news

  • Increasing current flow through the metal layers of the discharging path can also cause electromigration (EM) induced damages to interconnects.

    Electronicstalk - electronics industry news

  • It can conduct currents one thousand times greater than can copper, without electromigration [a form of structural decomposition within a material due to large current flows] 5.

    ZDNet UK Highlights

  • It can conduct currents one thousand times greater than can copper, without electromigration [a form of structural decomposition within a material due to large current flows] 5.

    ZDNet UK Highlights

  • It can conduct currents one thousand times greater than can copper, without electromigration [a form of structural decomposition within a material due to large current flows] 5.

    ZDNet UK Highlights

  • It can conduct currents one thousand times greater than can copper, without electromigration [a form of structural decomposition within a material due to large current flows] 5.

    ZDNet UK Highlights

  • It can conduct currents one thousand times greater than can copper, without electromigration [a form of structural decomposition within a material due to large current flows] 5.

    ZDNet UK Highlights

  • It can conduct currents one thousand times greater than can copper, without electromigration [a form of structural decomposition within a material due to large current flows] 5.

    ZDNet UK Highlights

  • CustomSim verifies complex power management designs at the transistor level by identifying IR drop, electromigration and standby leakage issues that can impact the reliability and performance of integrated circuits.

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  • By identifying and fixing voltage-drop and electromigration issues earlier in the flow, designers can eliminate costly iterations late in the design process.

    Electronicstalk - electronics industry news

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