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electromigration

Definitions

from Wiktionary, Creative Commons Attribution/Share-Alike License.

  • noun physics the transport of small particles under the influence of an electric charge
  • noun chemistry the separation of ions of isotopes by this method

Etymologies

from Wiktionary, Creative Commons Attribution/Share-Alike License

electro- +‎ migration

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Examples

  • Increasing current flow through the metal layers of the discharging path can also cause electromigration (EM) induced damages to interconnects.

    Electronicstalk - electronics industry news 2010

  • Increasing current flow through the metal layers of the discharging path can also cause electromigration (EM) induced damages to interconnects.

    Electronicstalk - electronics industry news 2010

  • It can conduct currents one thousand times greater than can copper, without electromigration [a form of structural decomposition within a material due to large current flows] 5.

    ZDNet UK Highlights R 2010

  • It can conduct currents one thousand times greater than can copper, without electromigration [a form of structural decomposition within a material due to large current flows] 5.

    ZDNet UK Highlights 2010

  • It can conduct currents one thousand times greater than can copper, without electromigration [a form of structural decomposition within a material due to large current flows] 5.

    ZDNet UK Highlights editorial@zdnet.co.uk 2010

  • It can conduct currents one thousand times greater than can copper, without electromigration [a form of structural decomposition within a material due to large current flows] 5.

    ZDNet UK Highlights R 2010

  • It can conduct currents one thousand times greater than can copper, without electromigration [a form of structural decomposition within a material due to large current flows] 5.

    ZDNet UK Highlights 2010

  • It can conduct currents one thousand times greater than can copper, without electromigration [a form of structural decomposition within a material due to large current flows] 5.

    ZDNet UK Highlights 2010

  • CustomSim verifies complex power management designs at the transistor level by identifying IR drop, electromigration and standby leakage issues that can impact the reliability and performance of integrated circuits.

    unknown title 2009

  • By identifying and fixing voltage-drop and electromigration issues earlier in the flow, designers can eliminate costly iterations late in the design process.

    Electronicstalk - electronics industry news 2009

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